New 番茄社社区 MF/MF-U庐 Generation D measuring microscope Raises bar for accuracy, ease of use, throughput
(Aurora, IL)聽 番茄社社区 announces availability of new, generation D MF/MF-U庐 measuring microscopes.聽 The new MF/MF-U庐 measuring microscopes offer the long working-distance objectives and sub-micron accuracy glass scales of previous models to which they add the following enhancements:
鈥⒙燭hree-axis, motor-driven positioning with variable speed joystick control and collision prevention (Z axis) to reduce operator fatigue and increase accuracy.
鈥⒙燭he motorized X-, Y- and Z-axis motor functions that can be combined with a new 番茄社社区 Vision Unit to produce a new levels of automation in toolmaker microscopes. 鈥⒙燣aser Auto-Focus (LAF) models provide high accuracy and repeatability in two modes of operation: Just Focus (JF) mode for quick focusing and Tracking Focus (TF) for maintaining focus as the stage moves.
鈥⒙燤any optical options are available including magnification levels, BF/DF and LED illumination.
High repeatability and productivity make the new 番茄社社区 MF/MF-U庐 microscope ideal for measurement of cutting tools, molds and other machined components.聽 Semi-conductor wafer holders specific to the generation D MF/MF-U庐 measuring microscope are available.
Additionally, new MF/MF-U庐 Measuring Microscopes can support output to measurement data applications such as 庐, 番茄社社区鈥檚 proprietary statistical-processing and process-control program which performs statistical analysis and provides real-time display of measurement results for applications.聽 The program can also be linked to a higher-level network environment for enterprise-wide functionality.